fig9

Defects in CdTe single crystals for photon-counting imaging

Figure 9. The EXAFS of Te K-edge of sample. (A) EXAFS (points) and fit (line), shown in multi-k-weighted (k1, k2, and k3) k-space. (B) EXAFS (points) and fit (line), shown in multi-k-weighted (k1, k2, and k3) R-space.

Microstructures
ISSN 2770-2995 (Online)

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