fig6

Figure 6. (A) EPR results for •O₂^- of H2 heterojunction under dark and Xe lamp light (30 and 60 min); (B) EPR results for •OH of H2 heterojunction under dark and light (30 and 60 min). (C-F) The in situ high-resolution XPS spectra for H2 heterojunction under dark and Xe lamp light: (C) Si 2p, (D) Ge 3d, (E) O 1s. (F) Partial enlarged view of (E).