fig10

Residual stress mapping of additively manufactured Inconel 718 via synchrotron X-ray diffraction

Figure 10. Distribution of residual strain for the (A) LD, (B) TD, and (C) ND in the additively manufactured Ni-based alloy sample, measured using synchrotron X-ray diffraction. Each map corresponds to a different crystallographic plane (hkl), as indicated above each panel. The color scale represents strain magnitude, with red indicating tensile strain and blue indicating compressive strain. LD: Loading direction; TD: transverse direction; ND: normal direction.

Microstructures
ISSN 2770-2995 (Online)

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