fig4

Micro-electromechanical system-based cryogenic and heating <i>in situ</i> transmission electron microscopy for investigating phase transitions and domain evolution in single-crystal BaTiO<sub>3</sub>

Figure 4. A-E: Representative BF TEM images obtained along [001] zone axis of the BTO sample during in situ heating process. The scale bars are 500 nm; F: the plot shows temperature (T) vs. time, with points A-E highlighted at different temperatures, corresponding to BF-TEM images labeled A-E. T: Tetragonal; R: rhombohedral phases; O: orthorhombic; TEM: transmission electron microscopy; BTO: BaTiO3; BF: bright-field; DW: domain wall.

Microstructures
ISSN 2770-2995 (Online)

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