fig2
Figure 2. Drift analysis in the cryo-STEM experiment at -175 °C. A: A representative HAADF STEM image from a sequence of 10 frames. The scale bar is 5 nm; B: the drift trajectory of a sample, indicated by the arrow showing the direction and spread of position changes over time. The origin presents the starting position. STEM: scanning transmission electron microscopy; HAADF: high-angle annular dark-field.
