fig1
Figure 1. (A) XRD diffraction pattern of a thickness-gradient sample (PZO/SRO/STO) ranging from 5 to 80 nm thick with a slope of ~7.5 nm/mm. The sample is 10 mm in length. The pattern exhibits a gradual shift of the PZO peaks, from the two peaks of the orthorhombic AFE phase dominant at higher thickness towards convolution with an emerging third peak with an intermediate lattice parameter, corresponding to the FE phase that becomes dominant in the thin region. (B) The lattice parameter of the PZO shifts with its thickness. (C-E) Reciprocal Space Map measurements of a gradient sample (PZO/SRO/STO) with a slope for the PZO of ~7.5 nm/mm, 80, 45 and 9 nm thick. The top signal close to STO corresponds to the SRO (
